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Graphical Determination of Single-Sample Attribute Plans for Individual Small Lots

Summary: When the number of defectives in a lot is small compared to the sizes of the lot and the sample, a sampling plan for that lot can be based on the Binomial II approximation to the hypergeometric distribution. A trial-and-error procedure is given for generating sampling plans by the graphical solution of this approximation.

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  • Topics:
  • Keywords: Short runs,Binomial distribution,Graphical methods
  • Author: Ladany, Shaul P.
  • Journal: Journal of Quality Technology