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Maximum Allowable Percent Defective (MAPD) Single Sampling Inspection by Attributes Plan

Summary: In this paper, Single Sampling Attributes Plans indexed by Maximum Allowable Percent Defectives (MAPD) are given. A table, for transition from one set of parameters to match the Operating Characteristic Curve (OC curve) to other similar sets, is given.

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  • Topics: Sampling
  • Keywords: Statistical methods,Attributes sampling plans
  • Author: Soundararajan, V.
  • Journal: Journal of Quality Technology