Exclusive Content & Downloads from ASQ

The Design and Use of V-Mask Control Schemes

Summary: V-mask control schemes provide significantly better performance than Shewhart control charts for detecting small shifts of the mean from goal conditions. This paper discusses the design and use of V-mask control schemes. An extensive discussion of a practical application in the chemical industry is given.

Anyone with a subscription, including Site and Enterprise members, can access this article.

Other Ways to Access content:

Join ASQ

Join ASQ as a Full member. Enjoy all the ASQ member benefits including access to many online articles.

Subscribe to Journal of Quality Technology

Access this and ALL OTHER Journal of Quality Technology online articles. You'll also receive the print version by mail.

  • Topics: Statistics
  • Keywords: V mask,Average run length (ARL),Decision making,Statistics,Cumulative sum control chart (CUSUM)
  • Author: Lucas, James M.
  • Journal: Journal of Quality Technology