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The Design and Use of V-Mask Control Schemes

Summary: V-mask control schemes provide significantly better performance than Shewhart control charts for detecting small shifts of the mean from goal conditions. This paper discusses the design and use of V-mask control schemes. An extensive discussion of a practical application in the chemical industry is given.

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  • Topics: Statistics
  • Keywords: V mask,Average run length (ARL),Decision making,Statistics,Cumulative sum control chart (CUSUM)
  • Author: Lucas, James M.
  • Journal: Journal of Quality Technology