ASQ

Exclusive Content & Downloads from ASQ

Silicon Crystal Termination--An Application of the Analysis of Means for Percent Defective Data

Summary: The late Dr. Ellis R. Ott has erected his own memorial by providing quality control practitioners with a useful tool for the direct graphical comparison of means. This paper discusses the application of his technique to the first processing step in semiconductor manufacturing. In particular, a simple dichotomous parameter is selected for analysis to demonstrate that significant gains can be realized when this appealing statistical procedure is coupled with quality team involvement.

Anyone with a subscription, including Site and Enterprise members, can access this article.


Other Ways to Access content:

Join ASQ

Join ASQ as a Full member. Enjoy all the ASQ member benefits including access to many online articles.

Subscribe to Journal of Quality Technology

Access this and ALL OTHER Journal of Quality Technology online articles. You'll also receive the print version by mail.

  • Topics: Data Quality
  • Keywords: Analysis Of Means (ANOM),Attribute data,Crystal growing,Termination
  • Author: Tomlinson, Lowell H.; Lavigna, Robert J.
  • Journal: Journal of Quality Technology