ASQ

Exclusive Content & Downloads from ASQ

Computer Experiments for Quality Control by Parameter Design

Summary: Taguchi's off-line quality control methods for product and process improvement emphasize experiments to design quality "into" products and processes. In Very Large Scale Integrated (VLSI) circuit design, the application of interest here, computer modeling is invariably quicker and cheaper than physical experimentation. Our approach models quality characteristics generated by the computer simulation as functions of both the engineering and noise parameters. This single experimental design for both types of parameters typically requires far fewer runs. The model is used to predict the quality characteristics, from which loss statistics can also be predicted and optimized. In the VLSI applications described, we obtain effective prediction of product performance with comparatively few observations.

Anyone with a subscription, including Site and Enterprise members, can access this article.


Other Ways to Access content:

Join ASQ

Join ASQ as a Full member. Enjoy all the ASQ member benefits including access to many online articles.

Subscribe to Journal of Quality Technology

Access this and ALL OTHER Journal of Quality Technology online articles. You'll also receive the print version by mail.

  • Topics: Quality Control
  • Keywords: Computers,Taguchi method,Response surfaces,Off-line quality control
  • Author: Welch, William J.; Yu, Tat-Kwan; Sacks, Jerome
  • Journal: Journal of Quality Technology