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Reliability Test Plans for One-Shot Devices Based on Repeated Samples

Summary: A "one-shot" device has the property that a successful test results in its destruction. An obvious example is the testing of an explosive device selected from a stockpile of military weapons. The type of data obtained differs from that of the standard life-testing situation. Such data is dichotomous (go or no go) rather than data obtained by measuring a continuous variable such as failure time or stress level. The emphasis in this paper is on test plans for periodic testing of highly reliable one-shot devices. Based on model assumptions, the sequence of minimal sample sizes, achieving specified reliability criteria, are derived.

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  • Topics: Reliability, Sampling
  • Keywords: Confidence limits,Reliability,Weibull analysis,Statistical tests,Sample size
  • Author: Bain, Lee; Engelhardt, Max
  • Journal: Journal of Quality Technology