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Process Monitoring with Multiple Product Grades

Summary: [This abstract is based on the authors' abstract.]

When multiple grades of the same product are manufactured on the same equipment, key product properties for each grade are usually monitored separately because of inherent differences among grades. Although effective, this approach is slow in detecting changes common to all grades. A simple method is proposed for combining and monitoring data from multiple grades allowing rapid detection of changes affecting all grades while permitting differentiation of overall process shifts from grade-specific shifts.

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  • Topics: Statistical Process Control (SPC)
  • Keywords: Statistical process control (SPC),Average run length (ARL),Continuous quality improvement (CQI),Exponentially weighted moving average control charts (EWMA)
  • Author: Doganaksoy, Necip; Schmee, Josef; Vandeven, Mark
  • Journal: Journal of Quality Technology