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Step-Stress Accelerated Degradation Analysis for Highly Reliable Products

Summary: [This abstract is based on the author's abstract. A longer abstract is available on the journal's website.]

Useful lifetime information for highly reliable products can be obtained by collecting accelerated degradation test (ADT) data if there is a product quality characteristic whose degradation over time can be related to reliability. It is very costly to conduct a constant-stress ADT, however. It is not applicable for assessing the lifetime of a newly developed product, since only a few test samples (prototypes) are typically available. Researchers propose a step-stress accelerated degradation test (SSADT) to overcome this problem. Using a case study of light emitting diodes data, an illustration of the proposed procedure is provided.

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  • Topics: Statistics
  • Keywords: Case study,Statistics
  • Author: Tseng, Sheng-Tsaing; Wen, Zhi-Chih
  • Journal: Journal of Quality Technology