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Systematic Patterns in T(2) Charts

Summary: [This abstract is based on the authors' abstract.] Proper diagnosis of nonrandom or systematic patterns occurring in a univariate Shewhart control chart can lead to process improvement by reducing the overall system variation. Process conditions are examined that lead to the occurrence of certain nonrandom patterns in a T(2) control chart. Results are applicable to either a Phase I or Phase II operation where the T(2) statistic is based on the most common covariance matrix estimator.

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  • Topics: Process Management, Statistical Process Control (SPC)
  • Keywords: Autocorrelation,Multivariate control chart,Process variability,Trend analysis,Statistical Process Control (SPC),T2 control charts,Shewhart control charts
  • Author: Mason, Robert L.; Chou, Youn-Min; Sullivan, Joe H.; Stoumbos, Zachary G.; Young, John C.
  • Journal: Journal of Quality Technology