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Multi-Resolution Wavelets Analysis Approach for the Recognition of Concurrent Control Chart Patterns

Summary: [This abstract is based on the author's abstract.]Most of the recent research on artificial neural networks (ANN) for control charts pattern recognition has been focused on the recognition of single trend, shift, or cyclic patterns. Multi-resolution wavelets analysis (MRWA) combined with ANN is shown to recognize both single and multiple concurrent patters of control charts. A reduced set of parameters derived from MRWA time-frequency coefficients is used as input to an ANN classifier resulting in adequate recognition of single and concurrent patterns.

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  • Topics: Engineering, Quality Control
  • Keywords: Concurrent engineering,Control charts,Statistical quality control (SQC),Pattern recognition,Neural networks
  • Author: Al-Assaf, Yousef
  • Journal: Quality Engineering