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Two Improved Runs Rules for the Shewhart X Control Chart

Summary: [This abstract is based on the authors' abstract.]A Shewhart X control chart incorporating runs rules is better for detecting small process shifts, thus enabling faster detection of assignable causes. Two improved runs rules are proposed, and average run lengths are computed and compared to existing rules. The comparison shows the new rules to be superior for the detection of large process average shifts and similar to others for the detection of small shifts.

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  • Topics:
  • Keywords: Average outgoing quality limit (AOQL),Control limits,Run rules,Runs tests,Shewhart control chart
  • Author: Khoo, Michael B.C.; Ariffin, Khotrun
  • Journal: Quality Engineering