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New Demerit Control Limits for Poisson Distributed Defects

Summary: [This abstract is based on the authors' abstract.]Defects may be categorized according to the degree to which they affect product quality. The weighted sum of each category's defects is considered an observation of demerits that may be monitored using a demerit control chart. Traditionally, this chart is constructed with parameters based on the normal distribution, and 3-sigma limits are established. These control limits have been improved upon by the use of the characteristic function of demerits. This study presents an alternative method for finding the exact distribution of demerits that gives results different from those produced with the characteristic function.

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  • Topics: Statistical Process Control (SPC), Data Quality
  • Keywords: Demerit chart,Poisson distribution,Statistical process control (SPC),Variable data
  • Author: Chimka, Justin R.; Cabrera Arispe, P. Vanessa
  • Journal: Quality Engineering