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Closed-Loop Defect Removal Model Using Statistical Process Control

Summary: [This abstract is based on the editor's abstract.]

A closed-loop defect removal model is introduced that is used for software quality management and defect prediction. The model addresses injected defects and escaped defects separately. Using statistical process control, specification limits are fixed for predicted values of defects, estimates are revised, causes of defects are analyzed, and preventative/corrective actions are taken. The result is better quality planning, control, and management.

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  • Topics: Quality Management, Statistical Process Control (SPC), Software Quality
  • Keywords: Prediction,Defects,Quality management (QM),Testing,Statistical process control (SPC),Software quality
  • Author: Jose, Achamma; Anju, N. K.; Pillai, S. K.
  • Journal: Software Quality Professional Magazine