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The Revised m-of-k Runs Rule

Summary: [This abstract is based on the authors' abstract.] The Shewhart control chart is the most widely used chart for monitoring the mean of the distribution of a quality characteristic, but it lacks the sensitivity to detect small shifts in the mean. Sensitizing rules based on runs and scans can increase the sensitivity of the Shewhart chart, but they may result in a reduction of in-control average run length. A revise m-of-k runs rule is proposed to overcome these weaknesses. Results from numerical experimentation and comparison with other control charts demonstrates an improved performance of the revised runs rule in the detection of small to moderate shifts while maintaining the ability to detect large shifts.

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  • Topics: Engineering
  • Keywords: Average run length (ARL), Control limits, Markov chains, Run rules, Shewhart control chart, X-bar control charts
  • Author: Antzoulakos, Demetrios L.; Rakitzis, Athanasios C.
  • Journal: Quality Engineering