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Discussion Two of "Reliability Meets Big Data: Opportunities and Challenges"

Summary: In this discussion of the article "Reliability Meets Big Data: Opportunities and Challenges" by William Q. Meeker and Yili Hong (Quality Engineering, Volume 26, Issue 1, pp. 102-116), Göb congratulates the authors for their work on relating the big data topic to the field of statistical reliability analysis. Similar studies related to the various fields of industrial and business statistics are necessary. Taking Meeker and Hong’s study as a starting point, the subsequent comments expand on issues of statistical analysis of big data in industrial and business practice. Three aspects are considered: identifying the problem with big and complex data, database and data management issues, and methodological challenges for the statistical analysis of big and complex data.

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  • Topics: Reliability, Data Quality
  • Keywords: Reliability, Field reliability, Data collection Maintenance, Covariance, Prognostics methodology, Warranties, Technology
  • Author: Göb, Rainer;
  • Journal: Quality Engineering