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A Process Yield for Simple Linear Profiles

Summary: Process capability analysis plays an important role in statistical quality control. In general, process capability indices are used to assess process performance. Additionally, process capability indices can be used to obtain the process yield. This article aims to evaluate the process yield for a simple linear profile in manufacturing processes. The authors present the statistical properties of the estimated process yield index for a simple linear profile and obtain its lower confidence bound. This index provides an exact measure of the process yield for a simple linear profile. A simulation study is conducted to assess the performance of the proposed method and other existing methods. The simulation results confirm that the estimated process yield value is close to the target value and has the smallest standard deviation. One real example is used to demonstrate the application of the proposed approach.

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  • Topics: Process Capability
  • Keywords: Statistical quality control (SQC), Confidence limits, Total process yield (TPY), Linear models, Manufacturing process
  • Author: Wang, Fu-Kwun;
  • Journal: Quality Engineering