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Supplementary: A Bayesian Approach to the Analysis of Split-Plot Combined and Product Arrays and Optimization

Summary: Supplementary Material for Bayesian Approach to the Analysis of Split‐Plot Combined and Product Arrays and Optimization in Robust Parameter Design, Film Example.

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  • Topics: Statistics
  • Keywords: Bayesian methods, Linear models, Markov chains, Monte Carlo methods, Prediction densities, Process optimization, Randomization tests, Response surface methodology (RSM), Robust design
  • Author: Robinson, Timothy J.; Pintar, Adam L.; Anderson-Cook, Christine M.; Hamada, Michael S.
  • Journal: Journal of Quality Technology