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Evaluating Experiments for Estimating the Bit Failure Cross-Section of Semiconductors Using a Colored Spectrum Neutron Beam

Summary: [This abstract is based on the authors' abstract.] The frequency of cosmic ray-induced bit flips in silicon-based electronic devices can be estimated by placing the device in a neutron beam at a testing facility. The bit failure cross-section describes the probability of causing a bit flip as a function of neutron energy. A general methodology is proposed for evaluating, prior to the experiment, the extent to which the experimental protocol permits estimation of the bit failure cross-section through nonparametric penalized maximum likelihood.

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  • Topics: Statistics
  • Keywords: Nonparametric methods, Likelihood methods, Error, Electronics, Computers, Failure analysis
  • Author: Hengartner, Nicolas W.; Michalak, Sarah E.; Takala, Bruce E.; Wender, Stephen A.
  • Journal: Technometrics