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Measurement System Analysis for Binary Data

Summary: [This abstract is based on the authors' abstract.] A methodology is described for the assessment of the repeatability and reproducibility of measurement systems that measure on a binary scale. The focus is on situations where no reference values can be obtained for the objects in the experiment, consequently resulting in a latent class model. Estimators provided are based on the maximum likelihood approach and the method of moments. Guidelines are given for model checking.

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  • Topics: Design of Experiments
  • Keywords: Ordered categories, Gauges, Capability, Reliability, Gage Repeatability and reproducibility studies (GR&R)
  • Author: Van Wieringen, Wessel N.; De Mast, Jeroen
  • Journal: Technometrics