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Degradation-Based Burn-In Planning Under Competing Risks

Summary: While previous burn-in test designs operate on a single failure mode subject to infant mortality, this article develops a burn-in plan framework with competing risks that differentiates between normal and infant mortality failure modes. The planning framework is applied to an electronic device with both a degradation threshold and a catastrophic failure mode. Three degradation-based burn-in models are proposed and demonstrated with the electronic device example, and three approaches to parameter estimation uncertainty are also proposed.

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  • Topics: Statistics
  • Keywords: Degradation, Estimation, Failure, Parameters, Gamma process
  • Author: Ye, Zhi-Sheng; Xie, Min; Shen, Yan; Tang, Loon-Ching
  • Journal: Technometrics