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Comment: Some Enhancements Over the Augmented Lagrangian Approach

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  • Topics: Software and Technology (for statistics, measurement, analysis), Statistics
  • Keywords: Additive penalty method, Emulator, Expected improvement, Gaussian process, Nonparametric regression and sequential design, Surrogate model
  • Author: Picheny, Victor; Ginsbourger, David; Krityakierne, Tipaluck
  • Journal: Technometrics