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  • Topics: Software and Technology (for statistics, measurement, analysis), Statistics
  • Keywords: Additive penalty method, Emulator, Expected improvement, Gaussian process, Nonparametric regression and sequential design, Surrogate model
  • Author: Gramacy, Robert B.; Gray, Genetha A.; Le Digabel, Sebastien; Lee, Herbert K. H.; Ranjan, Pritam; Wells, Garth; Wild, Stefan M.
  • Journal: Technometrics