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Supplementary material: Optimum Allocation Rule for Accelerated Degradation Tests With a Class of Exponential-Dispersion Degradation Models


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  • Topics: Statistics
  • Keywords: Accelerated degradation tests (ADTs), Optimum allocation, V-optimality, Exponential dispersion model
  • Author: Tseng, Sheng-Tsaing; Lee, I-Chen
  • Journal: Technometrics