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Supplemental - Statistical Process Control for Latent Quality Characteristics Using the Up-and-Down Test

Summary: Supplemental material to Techonometrics article titled "Statistical Process Control for Latent Quality Characteristics Using the Up-and-Down Test."

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  • Topics: Statistical Process Control (SPC)
  • Keywords: Binary data, Censored data, Control chart, Latent quality characteristics, Latent variable, SPC, Up-and-down test
  • Author: Xiang, Dongdong; Tsung, Fugee; Pu, Xiaolong
  • Journal: Technometrics